Innovative Contact Probes

Unveiled

Star Probe

KIYOTA presents Multi-Layered Micro Probe

9 PATENTS (including granted and pending)

　We designed the Fine-Pitched Contact Probes by an innovative concept.  
The Fine-Pitched Contact Probes are used for testing LSI, LCD and other applications that require a mechanically-compliant electrical contact system for circuit access.  
The probe tip, made from a beryllium Copper (BeCu) fashioned into a layered flat shape, can make contact with terminals that are spaced just 50 μm  apart.

50μm Equally spaced between tips
Super Long Life

Stability of contact and spring force
Decreased contact resistance

We are able to supply custom designed Fine-Pitched Contact Probes with receptacle.
Specifications
　　　　　Mechanical
  •  Space 40～200μm (between Probe-tips)
  •  Recommended working travel 200μm
  •  Layer build 400 layers
  •  Mechanical life 1.2×106 cycles
  •  Full travel 250μm
  •  Wiping travel 30～50μm(adjustable range)
  •  Spring force 1～8 g (adjustable range)
  •  Operating temperature range －55deg.～150deg.
             Electrical (static conditions)
  • DC resistance less than 0.06Ω
  • Insulation resistance more than 100 MΩ
  • Electrostatic capacity 30～100 pf

Specifications are subject to change or improvement without previous notice.

KIYOTA MANUFACTURING CO.
2-32-12 Kaminakazato Kita-ku Tokyo 114 Japan
Tel: 03-3912-2641 , Fax: 03-3914-8885

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